EMC Laboratory 
4000 Enterprise Dr. 
Missouri University of Science
and Technology
Rolla, MO 65401
emclab@mst.edu

Technical Papers Published in 2008

Index

"Using TEM Cell Measurements to Estimate the Maximum Radiation From PCBs With Cables Due to Magnetic Field Coupling"
Shaowei Deng; Hubing, T.H.; Beetner, D.G.;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 2, May 2008 Page(s):419 - 423

"Estimating Maximum Radiated Emissions From Printed Circuit Boards With an Attached Cable"
Shaowei Deng; Hubing, T.; Beetner, D.;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 1, Feb. 2008 Page(s):215 - 218

"Development and validation of a microcontroller model for EMC"
Shaohua Li; Bishnoi, H.; Whiles, J.; Pius Ng; Haixiao Weng; Pommerenke, D.; Beetner, D.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Time synchronized near-field and far-field for EMI source identification"
Gang Feng; Wei Wu; Pommerenke, D.; Jun Fan; Beetner, D.G.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 5

"Estimation of the statistical variation of crosstalk in wiring harnesses"
Wu, M.; Beetner, D.; Hubing, T.; Haixin Ke; Shishuang Sun;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 7

"The influence of test parameters on TEM cell measurements of ICs"
Kasturi, V.; Beetner, D.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems"
Muchaidze, G.; Jayong Koo; Qing Cai; Tun Li; Lijun Han; Martwick, A.; Kai Wang; Jin Min; Drewniak, J.L.; Pommerenke, D.;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 2, May 2008 Page(s):268 - 276

"Reconstruction of Dispersive Dielectric Properties for PCB Substrates Using a Genetic Algorithm"
Jianmin Zhang; Koledintseva, M.Y.; Drewniak, J.L.; Pommerenke, D.J.; DuBroff, R.E.; Zhiping Yang; Wheling Cheng; Rozanov, K.N.; Antonini, G.; Orlandi, A.;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 3, Part 2, Aug. 2008 Page(s):704 - 714

"Return via connections for extending signal link path bandwidth of via transitions"
Xin Chang; Archambeault, B.; Cocchini, M.; De Paulis, F.; Sivarajan, V.; Yaojiang Zhang; Jun Fan; Connor, S.; Orlandi, A.; Drewniak, J.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Automated near-field scanning to identify resonances"
Muchaidze, G.; Huang Wei; Jin Min; Shao Peng; Drewniak, J.; Pommerenke, D.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 5

"Characterization of serial links at 5.5Gbps on FR4 backplanes"
Ricchiuti, V.; Orlandi, A.; Drewniak, J.L.; De Paulis, F.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Modeling interference coupling between two orthogonal strip lines on adjacent layers"
Araki, K.; Fengchao Xiao; Kami, Y.; Bishnoi, H.; Drewniak, J.L.;;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Design methodology for PDN synthesis on multilayer PCBs"
Archambeault, B.; Cocchini, M.; Selli, G.; Jun Fan; Knighten, J.L.; Connor, S.; Orlandi, A.; Drewniak, J.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Efficient prediction of RF interference in a shielding enclosure with PCBs using a general segmentation method"
Yaojiang Zhang; Xiaopeng Dong; Zhenwei Yu; de Paulis, F.; Gang Feng; Mix, J.A.; Hua, D.; Slattery, K.; Drewniak, J.L.; Jun Fan;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 4

"Extraction of causal RLGC models from measurements for signal link path analysis"
Jianmin Zhang; Chen, Q.B.; Zhiqiang Qiu; Drewniak, J.L.; Orlandi, A.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"A concise multiple scattering method for via array analysis in a circular plate pair"
Yaojiang Zhang; Fan, J.; Chada, A.R.; Drewniak, J.L.;
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
10-12 Dec. 2008 Page(s):143 - 146

"Integral equation methods (MOM) in numerical modeling"
Ji Chen; Drewniak, J.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 5

"Noise coupling between signal and power/ground nets due to signal vias transitioning through power/ground plane pair"
Fan, J.; Cocchini, M.; Archambeault, B.; Knighten, J.L.; Drewniak, J.L.; Connor, S.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 5

"Analysis of distributed coupling along nonparallel traces using PEEC with phase term expansions"
Cracraft, M.A.; Drewniak, J.L.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"FIT numerical modeling for EMI Discovery and "Design""
Drewniak, J.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 11

"Block-by-block link-path analysis and design with physics-based models"
Drewniak, J.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 11

"Differential vias transition modeling in a multilayer printed circuit board"
Cocchini, M.; Wheling Cheng; Jianmin Zhang; Fisher, J.; Fan, J.; Drewniak, J.L.; Yaojiang Zhang;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 7

"Noise coupling between power/ground nets due to differential vias transitions in a multilayer PCB"
Cocchini, M.; Fan, J.; Archambeault, B.; Knighten, J.L.; Xin Chang; Drewniak, J.L.; Yaojiang Zhang; Connor, S.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"Simulation of Via Interconnects Using Physics-Based Models and Microwave Network Parameters"
Rimolo-Donadio, R.; Stepan, A.J.; Bruns, H.-D.; Drewniak, J.L.; Schuster, C.;
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
12-15 May 2008 Page(s):1 - 4

"Analysis of the thermal effects of GaAs FETs under the high-power electromagnetic pulses"
Jianfeng Xu; Wen-Yan Yin; Jun-Fa Mao; Le-Wei Li; Drewniak, J.L.;
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Volume 3, 21-24 April 2008 Page(s):1431 - 1434

"Correlation Between EUT Failure Levels and ESD Generator Parameters"
Jayong Koo; Qing Cai; Kai Wang; Maas, J.; Takahashi, T.; Martwick, A.; Pommerenke, D.;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 4, Nov. 2008 Page(s):794 - 801

"An Experimental Investigation of Higher Order Mode Suppression in TEM Cells"
Shaowei Deng; Pommerenke, D.; Hubing, T.; Dongshik Shin;
Electromagnetic Compatibility, IEEE Transactions on
Volume 50, Issue 2, May 2008 Page(s):416 - 419

"A circuit model for ESD performance analysis of printed circuit boards"
Byong-Su Seol; Jong-Sung Lee; Jae-Deok Lim; Hyungseok Lee; HarkByeong Park; Nandy, A.; Pommerenke, D.;
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
10-12 Dec. 2008 Page(s):120 - 123

"Jitter: Basics, relevance and measurement methods"
Pommerenke, D.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 14

"The repeatability of system level ESD test and relevant ESD generator parameters"
Jayong Koo; Qing Cai; Pommerenke, D.; Kai Wang; Mass, J.; Hirata, M.; Martwick, A.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"PCB ground fill design guidelines for radiated EMI"
Weifeng Pan; Pommerenke, D.; Shuai Xu; Jun Jia;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"Advanced EMI analysis methods"
Pommerenke, D.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 9

"Orthogonal loops probe design and characterization for near-field measurement"
Tun Li; Yong Cheh Ho; Pommerenke, D.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Advanced full wave ESD generator model for system level coupling simulation"
Cai Qing; Jayong Koo; Nandy, A.; Pommerenke, D.; Jong Sung Lee; Byong Su Seol;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"EMI analysis methods for synchronous buck converter EMI root cause analysis"
Kam, K.W.; Pommerenke, D.; Cheung-Wei Lam; Steinfeld, R.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 7

"Universal electric and magnetic field analyzer system"
Yong Cheh Ho; Pommerenke, D.; Tun Li;
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
19-23 May 2008 Page(s):391 - 394

"A Novel 24 GHz One-Shot, Rapid and Portable Microwave Imaging System"
Ghasr, M.T.; Abou-Khousa, M.A.; Kharkovsky, S.; Zoughi, R.; Pommerenke, D.;
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
12-15 May 2008 Page(s):1798 - 1802

"Eliminating via-plane coupling using ground vias for high-speed signal transitions"
Songping Wu; Xin Chang; Schuster, C.; Xiaoxiong Gu; Jun Fan;
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
27-29 Oct. 2008 Page(s):247 - 250

"Analysis of noise coupling from printed circuit board to shielding enclosure"
Zhenwei Yu; Xiaopeng Dong; Mix, J.; Slattery, K.; Jun Fan;
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
27-29 Oct. 2008 Page(s):159 - 162

"Aperture modeling using a hybrid method for RFI analysis"
Liehui Ren; Zhenwei Yu; Gang Feng; de Paulis, F.; Yaojiang Zhang; Jun Fan; Xiaopeng Dong; Mix, J.A.; Hua, D.; Lattery, K.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Closed-form expressions for determining approximate PMC boundaries around an aperture in a metal cavity wall"
de Paulis, F.; Yaojiang Zhang; Jun Fan; Mix, J.; Xiaopeng Dong; Hua, D.; Slattery, K.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"An Improved Color-Based Particle Filter for Object Tracking"
Yuan Chen; Shengsheng Yu; Jun Fan; Wenxin Chen; Hongxing Li;
Genetic and Evolutionary Computing, 2008. WGEC '08. Second International Conference on
25-26 Sept. 2008 Page(s):360 - 363

"Embedded capacitor technology: A real world example"
Smith, N.; Jun Fan; Andresakis, J.; Fukawa, Y.; Harvey, M.; Knighten, J.;
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
27-30 May 2008 Page(s):1919 - 1925

"Time synchronized near-field and far-field for EMI source identification"
Patil, S.K.; Koledintseva, M.Y.; Schwartz, R.W.; Huebner, W.;
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Volume 2, 23-28 Feb. 2008 Page(s):1 - 2

"Probes for diagnosing EMC problems"
Van Doren, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 6

"Analysis of a PCB-chassis system including different sizes of multiple planes based on SPICE"
Kobayashi, N.; Hubing, T.; Harada, T.;
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
8-12 Sept. 2008 Page(s):1 - 6

"Modeling experiences with full-wave frequency-domain modeling software"
Changyi Su; Xinbo He; Hua Zeng; Haixin Ke; Hubing, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Determining the maximum allowable heatsink voltage to ensure compliance with a given radiated emissions specification"
Xinbo He; Haixin Ke; Hubing, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Modeling experiences with full-wave time-domain modeling software"
Hua Zeng; Changyi Su; Haixin Ke; Hubing, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Automotive EMC"
Hubing, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 20

"Using component-level measurements to determine system-level radiated emissions"
Hubing, T.;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 9

"Inductance calculations for advanced packaging in high-performance computing"
Hocheol Kwak; Haixin, K.; Hubing, T.; Byoung Hwa Lee;
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
18-22 Aug. 2008 Page(s):1 - 4

"Effects of supporting structure on wireless SAR measurement"
Ayatollahi, M.; Jianxiang Shen; Rui Qiang; Ji Chen; Yihong Qi; Hubing, T.; Jarmuszewski, P.;
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
5-11 July 2008 Page(s):1 - 4

Index