Technical Papers Published in 2005

Index

A modified LU recombination method for improving the performance of boundary element methods at low frequencies,
H. Ke and T. Hubing
Journal of the Applied Computational Electromagnetics Society
vol. 20, no. 3, Nov. 2005, pp. 178-185.

Effective preconditioners for the solution of hybrid FEM/MoM matrix equations using combined formulations,
C. Guo and T. Hubing
Journal of the Applied Computational Electromagnetics Society
vol. 20, no. 2, July 2005, pp. 96-106.

Coupling Between Differential Signals and the DC Power-Bus in Multilayer PCBs,
C. Wang, M. Leone, J. Drewniak and A. Orlandi
IEEE Transactions on Advanced Packaging
vol. 28, no. 2, May 2005, pp. 337-345.

A new test setup and method for the calibration of current clamps,
D. Pommerenke, R. Chundru and S. Chandra
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 2, May 2005, pp. 335-343.

Traces in proximity to gaps in return planes,
T. Zeeff, T. Hubing and T. Van Doren
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 2, May 2005, pp. 388-392.

Wide-band Lorentzian media in the FDTD algorithm,
M. Koledintseva, J. Drewniak, D. Pommerenke, G. Antonini, A. Orlandi and K. Rozanov
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 2, May 2005, pp. 392-399.

Analysis of a low-pass filter employing a 4-Pin capacitor,
T. Zeeff, A. Ritter, T. Hubing and T. Van Doren
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 1, Feb. 2005, pp. 202-205.

Analytical model for the rectangular power-ground structure including radiation loss,
Richard L. Chen, Ji Chen, Todd H. Hubing and Weimin Shi
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 1, Feb. 2005, pp. 10-16.

A Brief History of EMC Education,
T. Hubing and A. Orlandi
Proc. of the 16th International Zurich Symp. and Technical Exhibition on EMC
Zurich, Switzerland, Feb. 2005, pp. 95-97.

Effective Strategies for Choosing and Locating Printed Circuit Board Decoupling Capacitors,
T. Hubing
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 632-637.br>

Neural Network Detection and Identification of Electronic Devices Based on their Unintended Emissions,
H. Weng, X. Dong, X. Hu, D. Beetner, T. Hubing and D. Wunsch
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 245-249.

Using an LU Recombination Method to Improve the Performance of the Boundary Element Method at Very Low Frequencies,
H. Ke and T. Hubing
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 442-445.

Determination of High Frequency Package Currents from Near-Field Scan Data,
X. Dong, S. Deng, D. Beetner, T. Hubing and T. Van Doren
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 679-683.

Engineering of Composite Media for Shields at Microwave Frequencies,
M. Koledintseva, et. al.
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 169-174.

Validation of Circuit Extraction Procedure by Means of Frequency and Time Domain Measurement,
G. Antonini, A. Ciccomancini Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 45-50.

A Three-Dimensional FDTD Subgridding Method with Separate Spatial and Temporal Subgridding Interfaces,
K. Xiao, D. Pommerenke and J. Drewniak
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 578-583.

Power Integrity Investigation of BGA Footprints by Means of the Segmentation Method,
G. Selli et. al.
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 655-659.

A Hybrid Approach to Decrease Port Influence in Transmission Line Characterization,
J. Zhang, et. al.
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 684-689.

EMI Specifics of Synchronous DC-DC Buck Converters,
Z. Li and D. Pommerenkebr> Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 711-714.

ESD Susceptibility Characterization of an EUT by Using 3D ESD Scanning System,
K. Wang, J. Koo, G. Muchaidze and D. Pommerenke
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 350-355.

EMI Debugging of Complex Systems using Different Time, Modulation, STFFT and Frequency Domain Signal Analysis Techniques,
Z. Li and D. Pommerenke
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 607-611.

Estimation of Current From Near-Field Measurement ,
H. Weng, D. Beetner, R. DuBroff and J. Shi
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 222-227.

Index