Technical Papers Published in 2012

Index

"From Maxwell Garnett to Debye Model for Electromagnetic Simulation of Composite Dielectrics---Part II: Random Cylindrical Inclusions"
Nisanci, M. H.; de Paulis, F.; Koledintseva, M. Y.; Drewniak, J. L.; Orlandi, A.; 
Electromagnetic Compatibility, IEEE Transactions on 
Volume: 54 , Issue: 2 
Digital Object Identifier: 10.1109/TEMC.2011.2162845 
Publication Year: 2012 , Page(s): 280 - 289 

"Model of Secondary ESD for a Portable Electronic Product"
Xiao, J.; Pommerenke, D.; Drewniak, J. L.; Shumiya, H.; Maeshima, J.; Yamada, T.; Araki, K.;
Electromagnetic Compatibility, IEEE Transactions on 
Volume: 54 , Issue: 3 
Digital Object Identifier: 10.1109/TEMC.2011.2171040 
Publication Year: 2012 , Page(s): 546 – 555

“Prediction of common-mode current reduction using ferrites in systems with cable harnesses”
Bondarenko, N; Peng Shao; Orlando, A.; Koledintseva, M.Y.; Beetner, D.G.; Berger, P. Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium
Digital Object Identifier: 10.1109/ISEMC.2012.6351807 
Publication Year: 2012 , Page(s): 80 – 84

“Locating Noncooperative Radio Receivers Using Wideband Stimulated Emissions””
Stagner, C.; Halligan, M.; Osterwise, C.; Beetner, D. G.; Grant, S. L.
Instrumentation and Measurement, IEEE Transactions on
Volume: 62, Issue: 3
Digital Object Identifier: 10.1109/TIM.2012.2219141 
Publication Year: 2013, Page(s): 667 – 674
 
“An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application”
Zhang, J.; Kam, K. W.; Min, J.; Khilkevich, V. V.; Pommerenke, D.; Fan, J.
Instrumentation and Measurement, IEEE Transactions on
Volume: 62 , Issue: 3 
Digital Object Identifier: 10.1109/TIM.2012.2218678
Publication Year: 2013, Page(s): 648 - 658
 
“An inductive probe for the measurement of common mode currents on differential traces
Khilkevich, V; Pommerenke, D.; Li Gang; Xu Shuai
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351645 
Publication Year: 2012, Page(s): 720 – 724
 
“Heat-Sink Modeling and Design With Dipole Moments Representing IC Excitation”
Yu, Z. Z.; Mix, J. A.; Sajuyigbe, S.; Slattery, K. P.; Pommerenke, D.; Fan, J.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 55, Issue: 1 
Digital Object Identifier: 10.1109/TEMC.2012.2210720 
Publication Year: 2013, Page(s): 168 - 174
 
“Portable Real-Time Microwave Camera at 24 GHz
Ghasr, M.T.; Abou-Khousa, M.A.; Kharkovsky, S.; Zoughi, R.; Pommerenke, D.
Antennas and Propagation, IEEE Transactions on
Volume: 60, Issue: 2
Digital Object Identifier: 10.1109/TAP.2011.2173145 
Publication Year: 2012, Page(s): 1114 - 1125
 
“On different methods to combine cable information into near-field data for far-field estimation
Keong Kam; Radchenko, A.; Pommerenke, D.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on Topic(s): Components, Circuits, Devices & Systems; Fields, Waves & Electromagnetics.
Digital Object Identifier: 10.1109/ISEMC.2012.6351767
Publication Year: 2012, Page(s): 294 - 300
 
“A novel method for ESD soft error analysis on integrated circuits using a TEM cell
Jongsung Lee; Jaedeok Lim; Byongsu Seol; Zhen Li; Pommerenke, D.
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th.
Publication Year: 2012, Page(s): 1 – 6
 
“An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone”
Tianqi Li; Maeshima, J.; Shumiya, H.; Pommerenke, D.J.; Yamada, T.; Araki, K.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on 2012
Page(s): 346 - 350
 
“Compact Ka-Band One-Port Vector Reflectometer Using a Wideband Electronically Controlled Phase Shifter”
Fallahpour, M.; Baumgartner, M.A.; Kothari, A.; Ghasr, M.T.; Pommerenke, D.; Zoughi, R. Instrumentation and Measurement, IEEE Transactions on
Volume: 61, Issue: 10, Digital Object Identifier: 10.1109/TIM.2012.2196389
Publication Year: 2012, Page(s): 2807 – 2816
 
“An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application”
Zhang, J.; Kam, K. W.; Min, J.; Khilkevich, V. V.; Pommerenke, D.; Fan, J.
Instrumentation and Measurement, IEEE Transactions on
Volume: 62 , Issue: 3
Digital Object Identifier: 10.1109/TIM.2012.2218678
Publication Year: 2013, Page(s): 648 - 658
 
“Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC”
Radchenko, A.; Ji Zhang; Keong Kam; Pommerenke, D.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351692
Publication Year: 2012, Page(s): 605 – 611
 
“Simulation of automotive EMC emission test procedures based on cable bundle measurements”
Gonser, M.; Keller, C.; Hansen, J.; Khillkevich, V.; Radchenko, A.; Pommerenke, D.; Weigel, R. Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Digital Object Identifier: 10.1109/MWSYM.2012.6259432
Publication Year: 2012, Page(s): 1 – 3
 
“From Maxwell Garnett to Debye Model for Electromagnetic Simulation of Composite Dielectrics—Part II: Random Cylindrical Inclusions”
Nisanci, M.H.; De Paulis, F.; Koledintseva, M.Y.; Drewniak, J.L.; Orlandi, A. 
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54, Issue: 2
Publication Year: 2012, Page(s): 280 - 289
 
“Differential Extrapolation Method for Separating Dielectric and Rough Conductor Losses in Printed Circuit Boards”
Koul, A. ; Koledintseva, M.Y. ; Hinaga, S. ; Drewniak, J.L. 
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54 , Issue: 2 
Digital Object Identifier: 10.1109/TEMC.2010.2087341 
Publication Year: 2012, Page(s): 421 – 433
 
“A Hierarchy of Explicit Low-Dispersion FDTD Methods for Electrically Large Problems”
Smith, W.S.; Razmadze, A.; Xuan-Min Shao; Drewniak, J.L.
Antennas and Propagation, IEEE Transactions on
Volume: 60, Issue: 12 
Digital Object Identifier: 10.1109/TAP.2012.2209860 
Publication Year: 2012, Page(s): 5787 – 5800
 
Signal integrity: Efficient, physics-based via modeling: Integration of striplines
Rimolo-Donadio, R. T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA Selli, G.; De Paulis, F.; Xiaoxiong Gu; Kwark, Y.H.; Drewniak, J.L.; Bruens, H.-D.; Schuster, C.
Electromagnetic Compatibility Magazine, IEEE, Summer 2012
Volume: 1, Issue: 2 
Digital Object Identifier: 10.1109/MEMC.2012.6244976 
Publication Year: 2012, Page(s): 74 – 81
 
“Analytical Transfer Functions Relating Power and Ground Voltage Fluctuations to Jitter at a Single-Ended Full-Swing Buffer”
Chulsoon Hwang; Jingook Kim; Achkir, B.; Jun Fan
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Volume: 3,  Issue: 1 
Digital Object Identifier: 10.1109/TCPMT.2012.2226723 
Publication Year: 2013, Page(s): 113 - 125
 
“Modeling and Application of Multi-Port TSV Networks in 3-D IC”
Wei Yao; Siming Pan; Achkir, B.; Jun Fan; Lei He
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume: 3, Issue: 1 
Digital Object Identifier: 10.1109/TCPMT.2012.2226723 
Publication Year: 2013, Page(s): 113 - 125
 
“Accuracy of Physics-Based Via Models for Simulation of Dense Via Arrays”
Müller, S.; Xiaomin Duan; Kotzev, M.; Yao-Jiang Zhang; Jun Fan; Xiaoxiong Gu; Kwark, Y.H.; Rimolo-Donadio, R.; Brüns, H.-D.; Schuster, C.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54, Issue: 5 
Digital Object Identifier: 10.1109/TEMC.2012.2192123 
Publication Year: 2012, Page(s): 1125 – 1136
 
“Heat-Sink Modeling and Design With Dipole Moments Representing IC Excitation”
Zhenwei Yu; Mix, J.A.; Sajuyigbe, S.; Slattery, K.P.; Pommerenke, D.; Jun Fan.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 55 , Issue: 1 
Digital Object Identifier: 10.1109/TEMC.2012.2210720
Publication Year: 2013, Page(s): 168 – 174
 
“Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network”
Jingook Kim; Liang Li; Songping Wu; Hanfeng Wang; Takita, Y.; Takeuchi, H.; Araki, K.; Jun Fan; Drewniak, J.L.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54, Issue: 5 
Digital Object Identifier: 10.1109/TEMC.2012.2194786 
Publication Year: 2012, Page(s): 1112 - 1124 
 
“An Improved Dipole-Moment Model Based on Near-Field Scanning for Characterizing Near-Field Coupling and Far-Field Radiation From an IC”
Zhenwei Yu; Mix, J.A.; Sajuyigbe, S.; Slattery, K.P.; Jun Fan.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 55, Issue: 1 
Digital Object Identifier: 10.1109/TEMC.2012.2207726 
Publication Year: 2013, Page(s): 97 – 108
 
“Characterization of Via Structures in Multilayer Printed Circuit Boards With an Equivalent Transmission-Line Model”
Siming Pan; Jun Fan.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54, Issue: 5
Digital Object Identifier: 10.1109/TEMC.2012.2187664 
Publication Year: 2012, Page(s): 1077 - 1086
 
“An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application”
Ji Zhang; Kam, K.W.; Jin Min; Khilkevich, V.V.; Pommerenke, D.; Jun Fan.
Instrumentation and Measurement, IEEE Transactions on
Volume: 62, Issue: 3 
Digital Object Identifier: 10.1109/TIM.2012.2218678 
Publication Year: 2013, Page(s): 648 - 658
 
“A Generalized Multiple Scattering Method for Dense Vias With Axially Anisotropic Modes in an Arbitrarily Shaped Plate Pair”
Yao-Jiang Zhang; Jun Fan
Microwave Theory and Techniques, IEEE Transactions on
Volume: 60, Issue: 7 
Digital Object Identifier: 10.1109/TMTT.2012.2195195 
Publication Year: 2012, Page(s): 2035 – 2045
 
“An Improved Multiple Scattering Method for Via Structures With Axially Isotropic Modes in an Irregular Plate Pair”
Yao-Jiang Zhang; Chada, A.R.; Jun Fan.
Electromagnetic Compatibility, IEEE Transactions on
Volume: 54, Issue: 2 
Digital Object Identifier: 10.1109/TEMC.2011.2162524, 
Publication Year: 2012, Page(s): 457 - 465
 
“PCB conductor surface roughness as a layer with effective material parameters”
Koledintseva, M.Y.; Razmadze, A.G.; Gafarov, A.Y.; Soumya De; Drewniak, J.L.; Hinaga, S. Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351795 
Publication Year: 2012, Page(s): 138 – 143
 
“Fast admittance computation for TSV arrays”
Dazhao Liu; Siming Pan; Achkir, B.; Jun Fan
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351755 
Publication Year: 2012, Page(s): 28 – 33
 
“EMI reduction evaluation with flexible absorbing materials and ferrite cores applied on cables”
Jing Li; Yao-Jiang Zhang; Gafarov, A.; De, S.; Koledintseva, M.Y.; Marchand, J.; Hess, D.; Durant, T.; Nickerson, E.; Drewniak, J.L.; Jun Fan.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351658 
Publication Year: 2012, Page(s): 646 - 651 
 
“Modeling and analysis of numerical wave tank based on the ALE algorithm”
Zhu, Feng; Zhu, Wei-hua; Fan, Jun; Fang, Bo; Zhao, Kun
Modelling, Identification & Control (ICMIC), 2012 Proceedings of International Conference on Publication Year: 2012, Page(s): 673 - 678
 
“Analytical representations for frequency dependences of microwave permeability”
Rozanov, K.N.; Koledintseva, M.Y.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351810 
Publication Year: 2012, Page(s): 422 - 427 
 
“Electromagnetic properties of metal granular composite materials for EMC applications”
Tsutaoka, T.; Tsurunaga, A.; Kasagi, T.; Hatakeyama, K.; Koledintseva, M.Y.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351812 
Publication Year: 2012, Page(s): 411 - 415
 
“Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box”
Sorensen, M.; Franek, O.; Pedersen, G.F.; Radchenko, A.; Keong Kam; Pommerenke, D. Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Digital Object Identifier: 10.1109/EMCEurope.2012.6396677 
Publication Year: 2012, Page(s): 1 - 6
 
“Capacitance calculation of TSVs using an integral equation method based on partial capacitances”
Hanfeng Wang; Yao-Jiang Zhang; Ruehli, A.; Jun Fan
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351799 
Publication Year: 2012, Page(s): 117 - 120
 
“Semi-automatic copper foil surface roughness detection from PCB microsection images”
Soumya De; Gafarov, A.; Koledintseva, M.Y.; Stanley, R.J.; Drewniak, J.L.; Hinaga, S., Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351796 
Publication Year: 2012, Page(s): 132 - 137 
 
“Modeling broadside coupled traces using equivalent per unit length (Eq PUL) RLGC model”
Chada, A.R.; Songping Wu; Jun Fan; Drewniak, J.L.; Mutnury, B.; de Araujo, D.N.
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on Digital Object Identifier: 10.1109/EPEPS.2012.6457911 
Publication Year: 2012, Page(s): 339 - 342 
 
“Accurate and efficient computation of power plane pair inductance”
Liang Li; Ruehli, A.E.; Jun Fan
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on Digital Object Identifier: 10.1109/EPEPS.2012.6457869 
Publication Year: 2012, Page(s): 167 - 170
 
“Studies of TEM mode assumption on via holes in via modelings”
Yao-Jiang Zhang; Shenhui Jing; Jun Fan
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Digital Object Identifier: 10.1109/APEMC.2012.6237873 
Publication Year: 2012, Page(s): 605 - 608
 
“A hybrid stack-up of printed circuit board for high-speed networking systems”
Jianmin Zhang; Scogna, A.C.; Jun Fan; Archambeault, B.; Drewniak, J.L.; Orlandi, A.
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6351671 
Publication Year: 2012, Page(s): 554 - 559
 
“Switching-current measurement for multiple ICs sharing a common power island structure”
Liang Li; Chulsoon Hwang; Tao Wang; Takita, Y.; Takeuchi, H.; Araki, K.; Jun Fan
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Digital Object Identifier: 10.1109/ISEMC.2012.6350932 
Publication Year: 2012, Page(s): 560 - 564